Adriene Lepiane Hanlon joins Maier & Maier after concluding an over 30 year career at the United States Patent and Trademark Office. Most recently, Ms. Hanlon was an Administrative Patent Judge (APJ) at the Patent Trial and Appeal Board (PTAB). She served in that position for over 30 years. As an Administrative Patent Judge, Ms. Hanlon handled ex parte appeals in all areas of inorganic and organic chemistry. Ms. Hanlon authored over 1700 decisions in ex parte appeals, including appeals in ex parte reexaminations, and served as a reviewing panel member in over 3400 ex parte appeals. She also presided over hearings and wrote interlocutory and final decisions in numerous interferences.
Prior to her appointment to the Board, Ms. Hanlon was an Associate Solicitor. In the Solicitor’s Office for the USPTO, she briefed and argued numerous cases at the Court of Appeals for the Federal Circuit (CAFC) and secured over 20 affirmances for the United States Patent and Trademark Office. She also handled cases at the United States District Court for the District of Columbia.
Ms. Hanlon began her career as an Examiner at the USPTO. Ms. Hanlon received a Bachelor of Science in Engineering degree, concentrating in Biomedical Engineering, from The Catholic University of America and a Juris Doctor from the Columbus School of Law at The Catholic University of America.
- Education
- BSE with a concentration in Biomedical Engineering, The Catholic University of America
- JD, Columbus School of Law, The Catholic University of America
- Admission
- Commonwealth of Pennsylvania
- United States Court of Appeals for the Federal Circuit
- Supreme Court of the United States